Abstract
The authors have investigated the tunnel magnetoresistance (TMR) effect of magnetic tunnel junctions (MTJs) with Co2FeAl0.5Si 0.5 full-Heusler electrodes and a MgP barrier in the thickness range of 1.5-2.5 nm. A cross-sectional transmission electron micrograph showed the epitaxial growth of both the upper and lower Co2FeAl 0.5Sin.5 layers and a MgO barrier and some distortion in the MgO barrier after annealing above 400 °C. An exponential dependence of resistance x area product on MgO barrier thickness was observed. TMR ratio was strongly affected by MgO barrier thickness, exhibiting maxima of 220% at room temperature and 390% at 5 K. The latter corresponds to the spin polarization of 0.81. It was also found that the features of this MTJ include a small asymmetry voltage and weak temperature dependence of its TMR ratio.
Original language | English |
---|---|
Pages (from-to) | L454-L456 |
Journal | Japanese Journal of Applied Physics |
Volume | 46 |
Issue number | 17-19 |
DOIs | |
Publication status | Published - 2007 May 11 |
Keywords
- CoFeAl Si
- Full-heusler
- Magnetic tunnel junction
- MgO barrier
- Tunnel magnetoresistance
- Tunneling spin polarization