TY - JOUR
T1 - Growth of Al doped Ca3TaGa3Si2O14piezoelectric single crystals with various Al concentrations
AU - Kudo, Tetsuo
AU - Yokota, Yuui
AU - Sato, Masato
AU - Tota, Kazushige
AU - Onodera, Ko
AU - Kurosawa, Shunsuke
AU - Kamada, Kei
AU - Yoshikawa, Akira
N1 - Funding Information:
This work was partially supported by Health Labour Sciences Research Grant, The Ministry of Health Labour and Welfare , Development of Systems and Technology for Advanced Measurement and Analysis, Japan Science and Technology Agency (JST) , Adaptable & Seamless Technology Transfer Program through Target-driven R&D (A-STEP) and Supporting Industry program, Ministry of Economy, Trade and Industry (METI) .
Publisher Copyright:
© 2014 Elsevier B.V.
PY - 2014/9/1
Y1 - 2014/9/1
N2 - Al-doped Ca3TaGa3Si2O14single crystals with various Al concentrations were grown by the micro-pulling-down method and their structure and chemical composition were investigated. Ca3Ta(Ga1-xAlx)3Si2O14crystals with x=0, 0.2, 0.4, 0.6, 0.8 and 1 were grown. They were highly transparent and a single phase of langasite-type structure was confirmed in the powder X-ray diffraction measurement. Their lattice parameters related to the a- and c-axes systematically decreased with increase in Al concentration. It followed from the EPMA analysis that the real Al concentration in the crystals almost corresponded to the nominal compositions.
AB - Al-doped Ca3TaGa3Si2O14single crystals with various Al concentrations were grown by the micro-pulling-down method and their structure and chemical composition were investigated. Ca3Ta(Ga1-xAlx)3Si2O14crystals with x=0, 0.2, 0.4, 0.6, 0.8 and 1 were grown. They were highly transparent and a single phase of langasite-type structure was confirmed in the powder X-ray diffraction measurement. Their lattice parameters related to the a- and c-axes systematically decreased with increase in Al concentration. It followed from the EPMA analysis that the real Al concentration in the crystals almost corresponded to the nominal compositions.
KW - A1. X-ray diffraction
KW - A2. Growth from melt
KW - B1. Langasite
KW - B1. Oxides
KW - B2. Piezoelectric materials
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U2 - 10.1016/j.jcrysgro.2014.02.021
DO - 10.1016/j.jcrysgro.2014.02.021
M3 - Article
AN - SCOPUS:84906959922
SN - 0022-0248
VL - 401
SP - 173
EP - 176
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
ER -