Growth of Cd_1-xZn_xTe(x∼0.04) films by hot-wall method and its evaluation

Cd_1-xZn_xTe(x∼0.04) films with a thickness of less than 300μm are grown on a ITO/glass substrate by hot wall method for obtaining good quality and electrically high resistive poly crystals sensitive to radial rays. A suitable growth condition is examined experimentally by discussing a relation between growth parameters such as the temperatures of growth, substrate and reservoir chambers, and the physical properties of the film grown under a specified condition. Sensitivity of the film to γ-rays is examined, and a possibility of the film used as an absorbing layer for radial rays is shown.