Growth temperature dependence of the LaAlO3/SrTiO3 interfacial structure

Yusuke Wakabayashi, Yoshihiro Yamasaki, Christopher Bell, Yasuyuki Hikita, Harold Y. Hwang, Tsuyoshi Kimura

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


The growth temperature dependence of the interfacial structure of LaAlO3 thin films on SrTiO3 substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.

Original languageEnglish
Article number012074
JournalJournal of Physics: Conference Series
Publication statusPublished - 2011
EventInternational Conference on Frustration in Condensed Matter, ICFCM - Sendai, Japan
Duration: 2011 Jan 112011 Jan 14


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