TY - JOUR
T1 - Growth temperature dependence of the LaAlO3/SrTiO3 interfacial structure
AU - Wakabayashi, Yusuke
AU - Yamasaki, Yoshihiro
AU - Bell, Christopher
AU - Hikita, Yasuyuki
AU - Hwang, Harold Y.
AU - Kimura, Tsuyoshi
PY - 2011
Y1 - 2011
N2 - The growth temperature dependence of the interfacial structure of LaAlO3 thin films on SrTiO3 substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.
AB - The growth temperature dependence of the interfacial structure of LaAlO3 thin films on SrTiO3 substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.
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U2 - 10.1088/1742-6596/320/1/012074
DO - 10.1088/1742-6596/320/1/012074
M3 - Conference article
AN - SCOPUS:81055147479
SN - 1742-6588
VL - 320
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
M1 - 012074
T2 - International Conference on Frustration in Condensed Matter, ICFCM
Y2 - 11 January 2011 through 14 January 2011
ER -