The growth temperature dependence of the interfacial structure of LaAlO3 thin films on SrTiO3 substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 2011|
|Event||International Conference on Frustration in Condensed Matter, ICFCM - Sendai, Japan|
Duration: 2011 Jan 11 → 2011 Jan 14