Hard X-ray fourier transform holography using a reference scatterer fabricated by electron-beam-assisted chemical-vapor deposition

M. Suzuki, Y. Kondo, S. Isogami, M. Tsunoda, S. Takahashi, S. Ishio

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

We present a fabrication method for a reference source that is efficient when used for lensless Fourier transform holography. This method produces a reference source that yields high spatial resolution and enhanced signal-to-noise ratio in a Fourier-transformed real-space image, and is particularly useful for Fourier transform holography experiments in the hard x-ray region.

Original languageEnglish
Title of host publication10th International Conference on X-Ray Microscopy
Pages293-296
Number of pages4
DOIs
Publication statusPublished - 2010
Event10th International Conference on X-Ray Microscopy - Chicago, IL, United States
Duration: 2010 Aug 152010 Aug 20

Publication series

NameAIP Conference Proceedings
Volume1365
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference10th International Conference on X-Ray Microscopy
Country/TerritoryUnited States
CityChicago, IL
Period10/8/1510/8/20

Keywords

  • coherence
  • Fourier transform holography
  • x-ray free electron laser
  • X-ray imaging
  • x-ray microscopy

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