Hard X-ray nanoimaging method using local diffraction from metal wire

Hidekazu Takano; Shigeki Konishi; Sho Shimomura; Hiroaki Azuma; Yoshiyuki Tsusaka; Yasushi Kagoshima

doi:10.1063/1.4861847

Hard X-ray nanoimaging method using local diffraction from metal wire

Hidekazu Takano, Shigeki Konishi, Sho Shimomura, Hiroaki Azuma, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journal › Article › peer-review

Abstract

A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be measured and rotating the sample to collect data for back projection calculations; the local diffraction occurring at the edges of the metal wire operates as a narrow line probe. In-line holograms of a test sample were obtained with a spatial resolution of better than 100 nm. The potential high spatial resolution of this method is shown by calculations using diffraction theory.

Original language	English
Article number	023108
Journal	Applied Physics Letters
Volume	104
Issue number	2
DOIs	https://doi.org/10.1063/1.4861847
Publication status	Published - 2014 Jan 13
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4861847

Cite this

@article{63cf7d100e8d4abe9ada6d8ecb23d8a3,

title = "Hard X-ray nanoimaging method using local diffraction from metal wire",

abstract = "A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be measured and rotating the sample to collect data for back projection calculations; the local diffraction occurring at the edges of the metal wire operates as a narrow line probe. In-line holograms of a test sample were obtained with a spatial resolution of better than 100 nm. The potential high spatial resolution of this method is shown by calculations using diffraction theory.",

author = "Hidekazu Takano and Shigeki Konishi and Sho Shimomura and Hiroaki Azuma and Yoshiyuki Tsusaka and Yasushi Kagoshima",

year = "2014",

month = jan,

day = "13",

doi = "10.1063/1.4861847",

language = "English",

volume = "104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Hard X-ray nanoimaging method using local diffraction from metal wire

AU - Takano, Hidekazu

AU - Konishi, Shigeki

AU - Shimomura, Sho

AU - Azuma, Hiroaki

AU - Tsusaka, Yoshiyuki

AU - Kagoshima, Yasushi

PY - 2014/1/13

Y1 - 2014/1/13

N2 - A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be measured and rotating the sample to collect data for back projection calculations; the local diffraction occurring at the edges of the metal wire operates as a narrow line probe. In-line holograms of a test sample were obtained with a spatial resolution of better than 100 nm. The potential high spatial resolution of this method is shown by calculations using diffraction theory.

AB - A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be measured and rotating the sample to collect data for back projection calculations; the local diffraction occurring at the edges of the metal wire operates as a narrow line probe. In-line holograms of a test sample were obtained with a spatial resolution of better than 100 nm. The potential high spatial resolution of this method is shown by calculations using diffraction theory.

UR - http://www.scopus.com/inward/record.url?scp=84893126687&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84893126687&partnerID=8YFLogxK

U2 - 10.1063/1.4861847

DO - 10.1063/1.4861847

M3 - Article

AN - SCOPUS:84893126687

SN - 0003-6951

VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

M1 - 023108

ER -

Hard X-ray nanoimaging method using local diffraction from metal wire

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this