Hard-X-Ray Phase-Difference Microscopy Using a Fresnel Zone Plate and a Transmission Grating

Wataru Yashiro, Y. Takeda, A. Takeuchi, Y. Suzuki, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

63 Citations (Scopus)


Novel hard x-ray phase imaging microscopy that simply uses an objective and a transmission grating is described. The microscope generated an image that exhibited twin features of a sample with an opposite phase contrast having a separation of a specific distance. Furthermore, the twin features were processed to generate an image mapping the x-ray phase shift through a simple algorithm. The presence of the grating did not degrade the spatial resolution of the microscope. The sensitivity of our microscope to light elements was about 2 orders of magnitude higher than that of the absorption contrast microscope that was attained by simply removing the grating. Our method is attractive for easily appending a quantitative phase-sensitive mode to normal x-ray microscopies, and it has potentially broad applications in biology and material sciences.

Original languageEnglish
Article number180801
JournalPhysical Review Letters
Issue number18
Publication statusPublished - 2009 Oct 28
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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