Hard X-ray photoelectron emission microscopy as tool for studying buried layers

Takanori Wakita; Toshiyuki Taniuchi; Kanta Ono; Motohiro Suzuki; Naomi Kawamura; Masafumi Takagaki; Hayato Miyagawa; Fang Zhun Guo; Tetsuya Nakamura; Takayuki Muro; Hiroyuki Akinaga; Takayoshi Yokoya; Masaharu Oshima; Keisuke Kobayashi

doi:10.1143/JJAP.45.1886

Hard X-ray photoelectron emission microscopy as tool for studying buried layers

Takanori Wakita, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Naomi Kawamura, Masafumi Takagaki, Hayato Miyagawa, Fang Zhun Guo, Tetsuya Nakamura, Takayuki Muro, Hiroyuki Akinaga, Takayoshi Yokoya, Masaharu Oshima, Keisuke Kobayashi

International Center for Synchrotron Radiation Innovation Smart (SRIS)

Research output: Contribution to journal › Article › peer-review

19 Citations (Scopus)

Abstract

We have performed photoelectron emission microscopy measurements with hard X-rays (HX-PEEM) and have shown that HX-PEEM has a spatial resolution higher than 106nm for observing the sample surface and can detect signals from a Au layer buried under a 50-nm-thick Co layer. These results mean that HX-PEEM has a probing depth one order of magnitude deeper than that of PEEM with soft X-rays. This deeper probing depth with HX-PEEM provides a new opportunity to investigate electronic and/or magnetic structures of buried layers under a thick overlayer. The notable advantages and potential applications of HX-PEEM are discussed.

Original language	English
Pages (from-to)	1886-1888
Number of pages	3
Journal	Japanese Journal of Applied Physics
Volume	45
Issue number	3 A
DOIs	https://doi.org/10.1143/JJAP.45.1886
Publication status	Published - 2006 Mar 8

Keywords

Buried layer
Deep probing depth
Hard X-rays
Photoelectron emission microscopy
Synchrotron radiation

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10.1143/JJAP.45.1886

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@article{c49880e8586044d58c2272b4649cd6a2,

title = "Hard X-ray photoelectron emission microscopy as tool for studying buried layers",

abstract = "We have performed photoelectron emission microscopy measurements with hard X-rays (HX-PEEM) and have shown that HX-PEEM has a spatial resolution higher than 106nm for observing the sample surface and can detect signals from a Au layer buried under a 50-nm-thick Co layer. These results mean that HX-PEEM has a probing depth one order of magnitude deeper than that of PEEM with soft X-rays. This deeper probing depth with HX-PEEM provides a new opportunity to investigate electronic and/or magnetic structures of buried layers under a thick overlayer. The notable advantages and potential applications of HX-PEEM are discussed.",

keywords = "Buried layer, Deep probing depth, Hard X-rays, Photoelectron emission microscopy, Synchrotron radiation",

author = "Takanori Wakita and Toshiyuki Taniuchi and Kanta Ono and Motohiro Suzuki and Naomi Kawamura and Masafumi Takagaki and Hayato Miyagawa and Guo, {Fang Zhun} and Tetsuya Nakamura and Takayuki Muro and Hiroyuki Akinaga and Takayoshi Yokoya and Masaharu Oshima and Keisuke Kobayashi",

year = "2006",

month = mar,

day = "8",

doi = "10.1143/JJAP.45.1886",

language = "English",

volume = "45",

pages = "1886--1888",

journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "3 A",

}

TY - JOUR

T1 - Hard X-ray photoelectron emission microscopy as tool for studying buried layers

AU - Wakita, Takanori

AU - Taniuchi, Toshiyuki

AU - Ono, Kanta

AU - Suzuki, Motohiro

AU - Kawamura, Naomi

AU - Takagaki, Masafumi

AU - Miyagawa, Hayato

AU - Guo, Fang Zhun

AU - Nakamura, Tetsuya

AU - Muro, Takayuki

AU - Akinaga, Hiroyuki

AU - Yokoya, Takayoshi

AU - Oshima, Masaharu

AU - Kobayashi, Keisuke

PY - 2006/3/8

Y1 - 2006/3/8

N2 - We have performed photoelectron emission microscopy measurements with hard X-rays (HX-PEEM) and have shown that HX-PEEM has a spatial resolution higher than 106nm for observing the sample surface and can detect signals from a Au layer buried under a 50-nm-thick Co layer. These results mean that HX-PEEM has a probing depth one order of magnitude deeper than that of PEEM with soft X-rays. This deeper probing depth with HX-PEEM provides a new opportunity to investigate electronic and/or magnetic structures of buried layers under a thick overlayer. The notable advantages and potential applications of HX-PEEM are discussed.

AB - We have performed photoelectron emission microscopy measurements with hard X-rays (HX-PEEM) and have shown that HX-PEEM has a spatial resolution higher than 106nm for observing the sample surface and can detect signals from a Au layer buried under a 50-nm-thick Co layer. These results mean that HX-PEEM has a probing depth one order of magnitude deeper than that of PEEM with soft X-rays. This deeper probing depth with HX-PEEM provides a new opportunity to investigate electronic and/or magnetic structures of buried layers under a thick overlayer. The notable advantages and potential applications of HX-PEEM are discussed.

KW - Buried layer

KW - Deep probing depth

KW - Hard X-rays

KW - Photoelectron emission microscopy

KW - Synchrotron radiation

UR - http://www.scopus.com/inward/record.url?scp=33644894536&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33644894536&partnerID=8YFLogxK

U2 - 10.1143/JJAP.45.1886

DO - 10.1143/JJAP.45.1886

M3 - Article

AN - SCOPUS:33644894536

SN - 0021-4922

VL - 45

SP - 1886

EP - 1888

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - 3 A

ER -

Hard X-ray photoelectron emission microscopy as tool for studying buried layers

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Keywords

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