Abstract
A method was developed for analyzing the feasibility of rapid x-ray scattering measurement for structure determination of nanowires in air. These crystalline nanowires were deposited on a crystal surfaces. When the x rays were incident perpendicular to the nanowires, the diffraction images pointed down at the direct beam position. The sheet-shape diffraction emanating from ultrathin NiO wires was observed using this method.
Original language | English |
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Pages (from-to) | 4239-4241 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2004 May 24 |