High-energy x-ray scattering in grazing incidence from nanometer-scale oxide wires

Osami Sakata, Masaki Takata, Hiroyoshi Suematsu, Akifumi Matsuda, Shusaku Akiba, Atsushi Sasaki, Mamoru Yoshimoto

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

A method was developed for analyzing the feasibility of rapid x-ray scattering measurement for structure determination of nanowires in air. These crystalline nanowires were deposited on a crystal surfaces. When the x rays were incident perpendicular to the nanowires, the diffraction images pointed down at the direct beam position. The sheet-shape diffraction emanating from ultrathin NiO wires was observed using this method.

Original languageEnglish
Pages (from-to)4239-4241
Number of pages3
JournalApplied Physics Letters
Volume84
Issue number21
DOIs
Publication statusPublished - 2004 May 24

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