High frequency magnetic near field measurement on LSI chip using planar multi-layer shielded loop coil

Norio Masuda, Jin Ching Bu, Naoya Tamaki, Masahiro Yamaguchi, Toshihide Kuriyama, Ken Ichi Arai

Research output: Contribution to journalConference articlepeer-review

28 Citations (Scopus)


Magnetic near-field measurements of circuitry are gathering increasing interest as an effective technique for detecting noise emission current sources. Against this background, we developed planar thick-film multi-layer shielded loop coils with loop apertures of 20 μm × 1000 μm and 600 μm × 600 μm. The shielded-loop structure's main feature is the cancellation of voltage induced by the electric field. A 60-μm wide microstrip line was used as the device under test (DUT). In a spatial resolution test conducted at 1GHz, we obtained optimum spatial resolution of 90 μm at the 6 dB degrading point for a rectangular coil with a 20 μm × 1000 μm aperture. This resolution level is 2.8 times better than that we obtained with our previous product comprising a low temperature co-fired ceramic (LTCC) board, because with the new coils we were able to successfully reduce the mean distance between the loop and the DUT. In measuring nonuniform magnetic field distribution near the 1.58 mm-wide microstrip line and the internal chip of a large-scale integrated (LSI) circuit, we found the new model could measure a finer distribution than our previous probe.

Original languageEnglish
Pages (from-to)80-85
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Publication statusPublished - 2003
Event2003 IEEE Symposium on Electromagnetic Compatibility - Boston, MA, United States
Duration: 2003 Aug 182003 Aug 22


  • Electromagnetic interference
  • High frequency
  • Large-scale integrated circuit
  • Magnetic near-field
  • Shielded loop probe
  • Spatial resolution
  • Thick-film process


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