Abstract
YBa2Cu3O7-y (YBCO) Josephson junctions on silicon (Si) substrates were fabricated by focused electron beam (FEB) irradiation. The junctions exhibit an operation temperature (T) dependence of current (I)-voltage (V) curves in the same manner as an SNS junction. As the temperature decreases, the junctions exhibit weak microwave-induced steps with flux flow-like I-V curves. At 25 K where the resistively shunted junction (RSJ)-like I-V curve appears, the junction exhibited the microwave-induced Shapiro steps up to 4 mV in dV/dI-V curves. This suggests that the junction can respond up to about 2 THz.
Original language | English |
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Pages (from-to) | L1096-L1099 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 36 |
Issue number | 8 SUPPL. B |
DOIs | |
Publication status | Published - 1997 Aug 15 |
Externally published | Yes |
Keywords
- FEB irradiation
- High frequency response
- Josephson junction
- Si
- YBaCuO
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)