High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe; Yuzuka Morita; Yuji Ohno; Tetsuya Miyashita; Hideo Fujikake; Tatsuo Uchida

doi:10.3169/mta.2.52

High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Hideo Fujikake, Tatsuo Uchida

ENG - Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

Original language	English
Pages (from-to)	52-59
Number of pages	8
Journal	ITE Transactions on Media Technology and Applications
Volume	2
Issue number	1
DOIs	https://doi.org/10.3169/mta.2.52
Publication status	Published - 2014

Keywords

Director profile simulation
Elastic constant measurement
Ellipsometry analysis
K22
Liquid crystal
Twisted nematic

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10.3169/mta.2.52

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abstract = "We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.",

keywords = "Director profile simulation, Elastic constant measurement, Ellipsometry analysis, K22, Liquid crystal, Twisted nematic",

author = "Takahiro Ishinabe and Yuzuka Morita and Yuji Ohno and Tetsuya Miyashita and Hideo Fujikake and Tatsuo Uchida",

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AU - Ishinabe, Takahiro

AU - Morita, Yuzuka

AU - Ohno, Yuji

AU - Miyashita, Tetsuya

AU - Fujikake, Hideo

AU - Uchida, Tatsuo

PY - 2014

Y1 - 2014

N2 - We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

AB - We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

KW - Director profile simulation

KW - Elastic constant measurement

KW - Ellipsometry analysis

KW - K22

KW - Liquid crystal

KW - Twisted nematic

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JO - ITE Transactions on Media Technology and Applications

JF - ITE Transactions on Media Technology and Applications

IS - 1

ER -

High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Abstract

Keywords

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