Abstract
Epitaxial TiO2 rutile films were grown at 200, 400 and 600°C by pulsed laser deposition (PLD) and their orientations were controlled by the use of α-Al2O3 (1000) and (101̄0) substrates. The crystallinity of the films grown at 600°C was higher than that of films deposited by other methods.
Original language | English |
---|---|
Pages (from-to) | 967-969 |
Number of pages | 3 |
Journal | Journal of Materials Science Letters |
Volume | 21 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2002 Jun 15 |