TY - JOUR
T1 - High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA
AU - Murano, T.
AU - Takahashi, H.
AU - Handa, N.
AU - Terauchi, M.
AU - Koike, M.
AU - Kawachi, T.
AU - Takashi, I.
AU - Hasegawa, N.
AU - Koeda, M.
AU - Nagano, T.
AU - Sasai, H.
AU - Oue, Y.
AU - Yonezawa, Z.
AU - Kuramoto, S.
PY - 2012/7
Y1 - 2012/7
N2 - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
AB - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
UR - http://www.scopus.com/inward/record.url?scp=85011484574&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85011484574&partnerID=8YFLogxK
U2 - 10.1017/S1431927612005739
DO - 10.1017/S1431927612005739
M3 - Article
AN - SCOPUS:85011484574
SN - 1431-9276
VL - 18
SP - 776
EP - 777
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
IS - S2
ER -