Abstract
CeO2 films were prepared at deposition temperature ranged from 947 to 1096 K (corresponding laser power was from 52 to 185 W) on (100) LaAlO3 single crystal substrate by laser chemical vapor deposition. At deposition temperature of 1027–1096 K (laser power was from 115 to 185 W), highly (100)-oriented CeO2 films with wedge-caped columnar grains were prepared, whose epitaxial growth relationship was CeO2 [100]//LAO [100] (CeO2 [010]//LAO [011]). Their full width at half maximum of the ω-scan on the (200) reflection and that of the ϕ-scan on the (220) reflection were 0.8°–1.8° and 0.7°–1.2°, respectively. The highest deposition rate at which CeO2 film with pure (100) preferred orientation could be obtained was 30 μm h−1.
Original language | English |
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Pages (from-to) | 3104-3110 |
Number of pages | 7 |
Journal | Journal of the American Ceramic Society |
Volume | 99 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2016 Sept 1 |
Keywords
- CeO buffer layer
- LaAlO single crystal
- epitaxial growth
- high deposition rate
- laser chemical vapor deposition
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry