High-temperature resistive surface grating for spectral control of thermal radiation

Hitoshi Sai; Yoshiaki Kanamori; Hiroo Yugami

doi:10.1063/1.1560867

High-temperature resistive surface grating for spectral control of thermal radiation

Hitoshi Sai, Yoshiaki Kanamori, Hiroo Yugami

Research output: Contribution to journal › Article › peer-review

158 Citations (Scopus)

Abstract

Spectral emittance and thermal stability of two-dimensional W gratings were investigated to obtain high-temperature resistive selective emitters. Numerical calculations based on rigorous coupled-wave analysis were performed to determine the structural profile of gratings with good spectral selectivity. The results indicate that the grating with 200 nm wall thickness shows very high thermal stability over 1400 K, while the polycrystalline grating is deformed at a high temperature because of the grain growth.

Original language	English
Pages (from-to)	1685-1687
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	11
DOIs	https://doi.org/10.1063/1.1560867
Publication status	Published - 2003 Mar 17

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "Spectral emittance and thermal stability of two-dimensional W gratings were investigated to obtain high-temperature resistive selective emitters. Numerical calculations based on rigorous coupled-wave analysis were performed to determine the structural profile of gratings with good spectral selectivity. The results indicate that the grating with 200 nm wall thickness shows very high thermal stability over 1400 K, while the polycrystalline grating is deformed at a high temperature because of the grain growth.",

author = "Hitoshi Sai and Yoshiaki Kanamori and Hiroo Yugami",

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AU - Kanamori, Yoshiaki

AU - Yugami, Hiroo

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N2 - Spectral emittance and thermal stability of two-dimensional W gratings were investigated to obtain high-temperature resistive selective emitters. Numerical calculations based on rigorous coupled-wave analysis were performed to determine the structural profile of gratings with good spectral selectivity. The results indicate that the grating with 200 nm wall thickness shows very high thermal stability over 1400 K, while the polycrystalline grating is deformed at a high temperature because of the grain growth.

AB - Spectral emittance and thermal stability of two-dimensional W gratings were investigated to obtain high-temperature resistive selective emitters. Numerical calculations based on rigorous coupled-wave analysis were performed to determine the structural profile of gratings with good spectral selectivity. The results indicate that the grating with 200 nm wall thickness shows very high thermal stability over 1400 K, while the polycrystalline grating is deformed at a high temperature because of the grain growth.

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High-temperature resistive surface grating for spectral control of thermal radiation

Abstract

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