High-throughput characterization of local conductivity of Nd                          0.9                         Ca                         0.1                         Ba                         2                         Cu                         3                         O                         7-δ                          thin film by the low-temperature scanning microwave microscope

Sohei Okazaki; Noriaki Okazaki; Xiaoru Zhao; Hidetaka Sugaya; Sei Ichiro Yaginuma; Ryota Takahashi; Makoto Murakami; Yuji Matsumoto; Toyohiro Chikyow; Hideomi Koinuma; Tetsuya Hasegawa

doi:10.1016/j.apsusc.2005.05.077

High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope

Sohei Okazaki, Noriaki Okazaki, Xiaoru Zhao, Hidetaka Sugaya, Sei Ichiro Yaginuma, Ryota Takahashi, Makoto Murakami, Yuji Matsumoto, Toyohiro Chikyow, Hideomi Koinuma, Tetsuya Hasegawa

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

We developed a scanning microwave microscope (SμM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Q λ/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti _1-x Co _x O _2-δ and Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ (NCBCO), it was demonstrated that this SμM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions.

Original language	English
Pages (from-to)	2615-2621
Number of pages	7
Journal	Applied Surface Science
Volume	252
Issue number	7
DOIs	https://doi.org/10.1016/j.apsusc.2005.05.077
Publication status	Published - 2006 Jan 21
Externally published	Yes
Event	Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI - Duration: 2004 Dec 7 → 2004 Dec 10

Keywords

Combinatorial materials science
Conductivity
Low-temperature scanning microwave microscope (LT-SμM)
Superconductivity
Ti Co o

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1016/j.apsusc.2005.05.077

Cite this

Okazaki, S., Okazaki, N., Zhao, X., Sugaya, H., Yaginuma, S. I., Takahashi, R., Murakami, M., Matsumoto, Y., Chikyow, T., Koinuma, H., & Hasegawa, T. (2006). High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope Applied Surface Science, 252(7), 2615-2621. https://doi.org/10.1016/j.apsusc.2005.05.077

High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope . / Okazaki, Sohei; Okazaki, Noriaki; Zhao, Xiaoru et al.
In: Applied Surface Science, Vol. 252, No. 7, 21.01.2006, p. 2615-2621.

Research output: Contribution to journal › Conference article › peer-review

Okazaki, S, Okazaki, N, Zhao, X, Sugaya, H, Yaginuma, SI, Takahashi, R, Murakami, M, Matsumoto, Y, Chikyow, T, Koinuma, H & Hasegawa, T 2006, ' High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope ', Applied Surface Science, vol. 252, no. 7, pp. 2615-2621. https://doi.org/10.1016/j.apsusc.2005.05.077

Okazaki S, Okazaki N, Zhao X, Sugaya H, Yaginuma SI, Takahashi R et al. High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope Applied Surface Science. 2006 Jan 21;252(7):2615-2621. doi: 10.1016/j.apsusc.2005.05.077

Okazaki, Sohei ; Okazaki, Noriaki ; Zhao, Xiaoru et al. / High-throughput characterization of local conductivity of Nd _0.9 Ca _0.1 Ba ₂ Cu ₃ O _7-δ thin film by the low-temperature scanning microwave microscope In: Applied Surface Science. 2006 ; Vol. 252, No. 7. pp. 2615-2621.

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abstract = " We developed a scanning microwave microscope (SμM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Q λ/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti 1-x Co x O 2-δ and Nd 0.9 Ca 0.1 Ba 2 Cu 3 O 7-δ (NCBCO), it was demonstrated that this SμM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions.",

keywords = "Combinatorial materials science, Conductivity, Low-temperature scanning microwave microscope (LT-SμM), Superconductivity, Ti Co o",

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AU - Zhao, Xiaoru

AU - Sugaya, Hidetaka

AU - Yaginuma, Sei Ichiro

AU - Takahashi, Ryota

AU - Murakami, Makoto

AU - Matsumoto, Yuji

AU - Chikyow, Toyohiro

AU - Koinuma, Hideomi

AU - Hasegawa, Tetsuya

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AB - We developed a scanning microwave microscope (SμM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Q λ/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti 1-x Co x O 2-δ and Nd 0.9 Ca 0.1 Ba 2 Cu 3 O 7-δ (NCBCO), it was demonstrated that this SμM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions.

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