TY - GEN
T1 - Homogeneity evaluation of Ca3Ta(Ga0.5Al0.5)3Si2O14 single crystal by the line-focus-beam ultrasonic material characterization system
AU - Ohashi, Yuji
AU - Kudo, Tetsuo
AU - Shoji, Yasuhiro
AU - Kurosawa, Shunsuke
AU - Yoshikawa, Akira
AU - Yokota, Yuui
AU - Kamada, Kei
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/29
Y1 - 2015/7/29
N2 - A new method for evaluating homogeneities of Ca3Ta(Ga0.5Al0.5)3Si2O14 (CTGAS) single crystal was investigated using leaky surface acoustic wave (LSAW) velocities measured by the line-focus-beam ultrasonic material characterization (LFB-UMC) system. LSAW velocity changes due to Al-substitution effect were successfully extracted by using a relationship between two LSAW velocities propagating along different directions for Ca3TaGa3Si2O14 (CTGS) and Al-doped CTGS. Al-concentration variation of 0.219 at% was detected in diameter direction of the crystal ingot through the LSAW velocity measurements for Y-cut CTGAS specimen. The velocity resolution to Al-concentration is estimated to be ±0.0046 at% for Y-cut Z-propagating LSAW.
AB - A new method for evaluating homogeneities of Ca3Ta(Ga0.5Al0.5)3Si2O14 (CTGAS) single crystal was investigated using leaky surface acoustic wave (LSAW) velocities measured by the line-focus-beam ultrasonic material characterization (LFB-UMC) system. LSAW velocity changes due to Al-substitution effect were successfully extracted by using a relationship between two LSAW velocities propagating along different directions for Ca3TaGa3Si2O14 (CTGS) and Al-doped CTGS. Al-concentration variation of 0.219 at% was detected in diameter direction of the crystal ingot through the LSAW velocity measurements for Y-cut CTGAS specimen. The velocity resolution to Al-concentration is estimated to be ±0.0046 at% for Y-cut Z-propagating LSAW.
KW - Langasite-type crystals
KW - chemical composition
KW - homogeneity evaluation
KW - leaky surface acoustic wave velocity
KW - line-focus-beam ultrasonic material characterization system
UR - http://www.scopus.com/inward/record.url?scp=84947902399&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84947902399&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2015.7172702
DO - 10.1109/ISAF.2015.7172702
M3 - Conference contribution
AN - SCOPUS:84947902399
T3 - 2015 Joint IEEE International Symposium on the Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop, ISAF/ISIF/PFM 2015
SP - 190
EP - 192
BT - 2015 Joint IEEE International Symposium on the Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop, ISAF/ISIF/PFM 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Joint IEEE International Symposium on the Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop, ISAF/ISIF/PFM 2015
Y2 - 24 May 2015 through 27 May 2015
ER -