Degradation behavior of thin-film Si photovoltaic modules by hygrothermal and thermal cyclic stresses was studied. Degradation progresses along the scribe lines for integration and from the slit on back sheet for taking out interconnector ribbons. Not only acetic acid generated by hydrolysis reaction between ethylene-vinyl acetate encapsulant and penetrating water vapor but also water vapor itself is the origin of degradation. It is important that high-barrier ability back sheet with low water-vapor transmission rate is employed and also important how suppress the water-vapor ingress from the slit on the back sheet. On the other hand, thin-film Si photovoltaic modules show high tolerance to thermal cyclic stress since only a few interconnector ribbons are employed.
|Title of host publication
|AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices
|Subtitle of host publication
|TFT Technologies and FPD Materials, Proceedings
|Institute of Electrical and Electronics Engineers Inc.
|Number of pages
|Published - 2017 Aug 8
|24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017 - Kyoto, Japan
Duration: 2017 Jul 4 → 2017 Jul 7
|AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings
|24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017
|17/7/4 → 17/7/7