Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

Kyoichi Suzuki, Kiyoshi Kanisawa, Simon Perraud, Mineo Ueki, Kei Takashina, Yoshiro Hirayama

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

We measure the spatial variation of the local density of states normal to an InAs/GaSb heterointerface on a cleaved cross-sectional surface by low-temperature scanning tunneling spectroscopy. Clear standing waves originating from the interference between the incident and reflected electron waves at the interface are observed.

Original languageEnglish
Pages (from-to)2618-2621
Number of pages4
JournalJapanese Journal of Applied Physics
Volume46
Issue number4 B
DOIs
Publication statusPublished - 2007 Apr 24

Keywords

  • Cleaved surface
  • Electron interference
  • Local density of states
  • Scanning tunneling spectroscopy
  • Semiconductor heterostructure

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