TY - JOUR
T1 - Improvement of oxidation resistance of an Fe-Mn-Si-Cr shape memory alloy by annealing under vacuum
AU - Fukai, Hiroyuki
AU - Suzuki, Shigeru
AU - Masahashi, Naoya
AU - Hanada, Shuji
AU - Maruyama, Tadakatsu
AU - Kubo, Hiroshi
AU - Waseda, Yoshio
PY - 2005/8
Y1 - 2005/8
N2 - Electron microprobe microanalysis (EPMA), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS) were used for charactering the surface composition of an Fe-Mn-Si-Cr shape memory alloy. The effect of annealing under vacuum on the surface composition of the alloy was studied. It was found that the amount of manganese decreased, while the amount of chromium increased in a surface layer by annealing. The thickness of the surface layer is of the order of ten micrometers, which is comparable to that obtained by conventional plating or coating. As a result, the surface of the Fe-Mn-Si shape memory alloy annealed under a vacuum exhibited better oxidation resistant than that of the as-lapped alloy.
AB - Electron microprobe microanalysis (EPMA), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS) were used for charactering the surface composition of an Fe-Mn-Si-Cr shape memory alloy. The effect of annealing under vacuum on the surface composition of the alloy was studied. It was found that the amount of manganese decreased, while the amount of chromium increased in a surface layer by annealing. The thickness of the surface layer is of the order of ten micrometers, which is comparable to that obtained by conventional plating or coating. As a result, the surface of the Fe-Mn-Si shape memory alloy annealed under a vacuum exhibited better oxidation resistant than that of the as-lapped alloy.
KW - Oxidation
KW - Secondary ion mass spectrometry
KW - Shape memory alloy
KW - X-ray photoelectron spectroscopy
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U2 - 10.2320/matertrans.46.1745
DO - 10.2320/matertrans.46.1745
M3 - Article
AN - SCOPUS:26944447517
SN - 1345-9678
VL - 46
SP - 1745
EP - 1748
JO - Materials Transactions
JF - Materials Transactions
IS - 8
ER -