Improvement of spatial resolution in phase-contrast X-ray computed tomography

Atsushi Momose, Ichiro Koyama, Keiichi Hirano

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)


Image quality of phase-contrast X-ray computed tomogram was evaluated by comparing tomograms obtained by using triple Lane-case X-ray interferometers with a thin or a thick crystal wafer. It was confirmed that the spatial resolution was improved when the wafer is thinned. A simulation study by means of the Takagi-Taupin equation was also carried out for theoretical understanding. According to the wavefront modulation transfer function calculated for Laue-case diffraction, it is suggested that using an interferometer with a thin wafer tends to improve image quality. However, a new problem is pointed out that the accuracy in quantitative measurement of high-frequency phase modulation is not secured even when the wafer is thinned.

Original languageEnglish
Pages (from-to)71-81
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Publication statusPublished - 2001
EventDevelopments in X-Ray Tomography III - San Diego, CA, United States
Duration: 2001 Aug 22001 Aug 3


  • Microtomography
  • Phase contrast
  • Spatial resolution
  • Takagi-Taupin equation
  • X-ray interferometer


Dive into the research topics of 'Improvement of spatial resolution in phase-contrast X-ray computed tomography'. Together they form a unique fingerprint.

Cite this