In situ angle-resolved photoemission study on La1 - XSr xMnO3 thin films grown by laser MBE

A. Chikamatsu, H. Wadati, M. Takizawa, R. Hashimoto, H. Kumigashira, M. Oshima, A. Fujimori, N. Hamada, T. Ohnishi, M. Lippmaa, K. Ono, M. Kawasaki, H. Koinuma

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3 Citations (Scopus)


We have performed an in situ angle-resolved photoemission study of atomically flat surfaces of La1 - xSrxMnO3 (LSMO) single-crystal thin films grown on SrTiO3 (0 0 1) substrates by laser molecular beam epitaxy, and investigated the changes in the band structure induced by hole-doping. The band structures of LSMO x = 0.4 thin films consist of several highly dispersive O 2p-derived bands at the binding energies of 2.5-7 eV, almost dispersionless Mn 3d t2g bands at ∼2 eV, and a dispersive Mn 3d eg-derived majority band at ∼0.5 eV. We find that the energy positions of these bands monotonically shift toward higher binding energy with decreasing hole concentration in a rigid-band manner, whereas the lower binding energy part of the eg-derived emission within 1.5 eV of the Fermi level (EF) gradually disappears. These results suggest that the simple rigid-band model does not describe the electronic structure near EF of LSMO.

Original languageEnglish
Pages (from-to)511-514
Number of pages4
JournalJournal of Electron Spectroscopy and Related Phenomena
Publication statusPublished - 2005 Jun


  • Angle-resolved photoelectron spectroscopy
  • Band structure
  • LaSrMnO thin film
  • Laser molecular beam epitaxy


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