In situ evaluation method for on-chip inductors using oscillator response

Mizuki Motoyoshi; Minora Fujishima

doi:10.1109/CICC.2006.320951

In situ evaluation method for on-chip inductors using oscillator response

Mizuki Motoyoshi, Minora Fujishima

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

It is difficult to obtain the characteristics of on-chip inductors on site since conventional evaluation requires dedicated test devices. In this paper, in-situ evaluation of both inductance and resistance of on-chip inductors Without dedicated test devices is proposed, where on-chip inductors are evaluated on the basis of the threshold current for oscillation and oscillation frequency without being affected by lead Wires. The proposed method was verified by measurement, and it is found that the error against the evaluation result using a network analyzer is less than 3%.

Original language	English
Title of host publication	Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages	369-372
Number of pages	4
DOIs	https://doi.org/10.1109/CICC.2006.320951
Publication status	Published - 2006 Dec 1
Externally published	Yes
Event	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States Duration: 2006 Sept 10 → 2006 Sept 13

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
ISSN (Print)	0886-5930

Other

Other	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Country/Territory	United States
City	San Jose, CA
Period	06/9/10 → 06/9/13

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/CICC.2006.320951

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Motoyoshi, M & Fujishima, M 2006, In situ evaluation method for on-chip inductors using oscillator response. in Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006., 4114981, Proceedings of the Custom Integrated Circuits Conference, pp. 369-372, IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, San Jose, CA, United States, 06/9/10. https://doi.org/10.1109/CICC.2006.320951

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abstract = "It is difficult to obtain the characteristics of on-chip inductors on site since conventional evaluation requires dedicated test devices. In this paper, in-situ evaluation of both inductance and resistance of on-chip inductors Without dedicated test devices is proposed, where on-chip inductors are evaluated on the basis of the threshold current for oscillation and oscillation frequency without being affected by lead Wires. The proposed method was verified by measurement, and it is found that the error against the evaluation result using a network analyzer is less than 3%.",

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year = "2006",

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doi = "10.1109/CICC.2006.320951",

language = "English",

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series = "Proceedings of the Custom Integrated Circuits Conference",

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N2 - It is difficult to obtain the characteristics of on-chip inductors on site since conventional evaluation requires dedicated test devices. In this paper, in-situ evaluation of both inductance and resistance of on-chip inductors Without dedicated test devices is proposed, where on-chip inductors are evaluated on the basis of the threshold current for oscillation and oscillation frequency without being affected by lead Wires. The proposed method was verified by measurement, and it is found that the error against the evaluation result using a network analyzer is less than 3%.

AB - It is difficult to obtain the characteristics of on-chip inductors on site since conventional evaluation requires dedicated test devices. In this paper, in-situ evaluation of both inductance and resistance of on-chip inductors Without dedicated test devices is proposed, where on-chip inductors are evaluated on the basis of the threshold current for oscillation and oscillation frequency without being affected by lead Wires. The proposed method was verified by measurement, and it is found that the error against the evaluation result using a network analyzer is less than 3%.

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SN - 9781424400768

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BT - Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006

T2 - IEEE 2006 Custom Integrated Circuits Conference, CICC 2006

Y2 - 10 September 2006 through 13 September 2006

ER -

In situ evaluation method for on-chip inductors using oscillator response

Abstract

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