Abstract
An alternating magnetizing system has been developed for in situ Lorentz microscopy for soft magnetic materials in an alternating magnetic field. The electron trajectory in the system is discussed using a simulation based on a simple model. It is clarified that the frequency and amplitude of the alternating magnetic field and the defocus of the objective mini lens can be selected as desired values. The system is successfully applied to the observation of domain wall motion in a soft magnetic material, Fe84.9Al5.5Si9.6 (wt%) (Sendust). The system is very promising for investigating interactions between domain walls and lattice defects in various kinds of soft magnetic materials. The Author 2010. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 207-213 |
| Number of pages | 7 |
| Journal | Journal of Electron Microscopy |
| Volume | 59 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2010 Jun |
Keywords
- Alternating magnetic field
- In situ observation
- Lorentz microscopy
- Soft magnetic materials
ASJC Scopus subject areas
- Instrumentation