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Influence of oxide semiconductor thickness on TFT characteristics
Mitsuru Nakata, Hiroshi Tsuji, Hiroto Sato, Yoshiki Nakajima, Yoshihide Fujisaki, Tatsuya Takei, Toshihiro Yamamoto, Hideo Fujikake
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
7
Citations
(Scopus)