TY - JOUR
T1 - Influence of substrate temperature on CeF3 thin films prepared by thermal evaporation
AU - Dorai, Arun Kumar
AU - Subramanian, Selvasekarapandian
AU - Hellar, Nithya
AU - Leiro, Jarkko
N1 - Funding Information:
One of the author Dr. D. Arun Kumar thanks DRDO-BU center for life sciences for providing senior research fellowship. The author would like to extend his thanks to Dr. S. Amirthapandian, IGCAR, Kalpakkam - 603102, India for HRSEM characterization.
PY - 2014/1/15
Y1 - 2014/1/15
N2 - We have investigated the effect of substrate temperature on the structural, compositional and electrical properties of cerium fluoride thin films prepared by thermal evaporation method. The structure of cerium fluoride is hexagonal and the growth orientation changes with increase in substrate temperature. The substrate temperature favors the growth of vertical nanorods on the surface of the thin films. The compositional analysis confirms the formation of cerium oxyfluoride, leading to free fluoride ions. Electrical conductivity increases with increasing substrate temperature.
AB - We have investigated the effect of substrate temperature on the structural, compositional and electrical properties of cerium fluoride thin films prepared by thermal evaporation method. The structure of cerium fluoride is hexagonal and the growth orientation changes with increase in substrate temperature. The substrate temperature favors the growth of vertical nanorods on the surface of the thin films. The compositional analysis confirms the formation of cerium oxyfluoride, leading to free fluoride ions. Electrical conductivity increases with increasing substrate temperature.
KW - Electrical conductivity
KW - Physical vapour deposition
KW - Thin films
KW - XPS
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U2 - 10.1016/j.matchemphys.2013.10.011
DO - 10.1016/j.matchemphys.2013.10.011
M3 - Article
AN - SCOPUS:84888199187
SN - 0254-0584
VL - 143
SP - 765
EP - 772
JO - Materials Chemistry and Physics
JF - Materials Chemistry and Physics
IS - 2
ER -