TY - JOUR
T1 - Information observed in Ti-Lα,β and Ti-Lℓ,η emission lines of Ti and its oxides
AU - Terauchi, M.
AU - Koshiya, S.
AU - Kimito, K.
N1 - Publisher Copyright:
© Published under licence by IOP Publishing Ltd.
PY - 2018/1/25
Y1 - 2018/1/25
N2 - Ti L-emission lines of metal-Ti and its oxides are measured by using a soft-X-ray emission spectrometer attached to a scanning electron microscope. Lα,β emissions due to electron transitions from valence 3d states to core 2p levels show a variety of intensity distributions for Ti oxides with different crystal structures reflecting different bonding states. Lℓ,η-emissions are due to transitions from 3s level to 2p levels and show simple intensity distribution. The energy shift of Lℓ,η-emission peak should reflect a relaxation energy in the final state with a hole in 3 s level. The information of L-emission spectrum is discussed based on a chemical shift of photoemission experiment.
AB - Ti L-emission lines of metal-Ti and its oxides are measured by using a soft-X-ray emission spectrometer attached to a scanning electron microscope. Lα,β emissions due to electron transitions from valence 3d states to core 2p levels show a variety of intensity distributions for Ti oxides with different crystal structures reflecting different bonding states. Lℓ,η-emissions are due to transitions from 3s level to 2p levels and show simple intensity distribution. The energy shift of Lℓ,η-emission peak should reflect a relaxation energy in the final state with a hole in 3 s level. The information of L-emission spectrum is discussed based on a chemical shift of photoemission experiment.
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U2 - 10.1088/1757-899X/304/1/012018
DO - 10.1088/1757-899X/304/1/012018
M3 - Conference article
AN - SCOPUS:85041679867
SN - 1757-8981
VL - 304
JO - IOP Conference Series: Materials Science and Engineering
JF - IOP Conference Series: Materials Science and Engineering
IS - 1
M1 - 012018
T2 - 15th European Workshop on Modern Developments and Applications in Microbeam Analysis, EMAS 2017 and 7th Meeting of the International Union of Microbeam Analysis Societies, IUMAS 2017
Y2 - 7 May 2017 through 11 May 2017
ER -