We report the lateral and vertical electrical conduction properties of PdCrO2 thin films grown on insulating Al2O3 (001) and conducting β-Ga2O3 (2 ¯ 01) substrates. The c-axis oriented PdCrO2 films on the both substrates showed metallic temperature dependence of in-plane resistivity down to 2 K. In PdCrO2/β-Ga2O3 vertical devices, rectifying current density-voltage (J-V) characteristics revealed the formation of a Schottky barrier at the PdCrO2/β-Ga2O3 interface. The Schottky barrier height (SBH) of 1.2-1.8 eV, evaluated by J-V characteristics, is significantly larger than 0.8 eV expected from the usual Mott-Schottky relation based on the electron affinity of β-Ga2O3 (4.0 eV) and the work function of PdCrO2 (4.8 eV) determined by ultraviolet photoelectron spectroscopy. The enhanced SBH at the PdCrO2/β-Ga2O3 interface indicates the existence of interface dipoles, as in the case of PdCoO2/β-Ga2O3. Besides, we observed a large difference of the SBH between the J-V measurements (1.2-1.8 eV) and capacitance measurements (2.0-2.1 eV). While the SBH is definitely enhanced by the interface dipole effect, the level of enhancement at the PdCrO2/β-Ga2O3 interface is rather inhomogeneous, different from that at the PdCoO2/β-Ga2O3. In fact, two typical types of interfaces were found by a high-angle annular dark-field scanning transmission electron microscope, which would be the origin of the inhomogeneous SBH. Further understanding of the interface formation between delafossite oxides and β-Ga2O3 (2 ¯ 01) will improve the performance of Ga2O3 Schottky junctions as a power diode available at high temperatures.