Abstract
Local structure, chemistry, and bonding at interfaces often radically affect the properties of materials. A combination of scanning transmission electron microscopy and density functional theory calculations reveals an atomic layer of carbon at a SiC/ Ti3SiC2 interface in Ohmic contact to p-type SiC (see image), which results in stronger adhesion, a lowered Schottky barrier, and enhanced transport. This is a key factor to understanding the origin of the Ohmic nature.
Original language | English |
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Pages (from-to) | 4966-4969 |
Number of pages | 4 |
Journal | Advanced Materials |
Volume | 21 |
Issue number | 48 |
DOIs | |
Publication status | Published - 2009 Dec 28 |
ASJC Scopus subject areas
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering