Interface Fermi level pinning in a Cu/p-CuGaS2 Schottky diode

M. Sugiyama, R. Nakai, H. Nakanishi, Sf Chichibu

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A Schottky contact to p-type CuGaS2 that showed the highest rectification ratio of approximately 500 ever reported was realized using a Cu electrode on a HF/HNO3-treated surface, as well as an excellent Au ohmic contact on a HF-etched surface. The effective Schottky barrier height of 0.9 eV was obtained from the current-voltage and capacitance-voltage characteristics. The value was smaller by 1.1 eV than that calculated from the values of the work function of Cu and electron affinity of CuGaS2. The results indicated a surface pinning of the Fermi level to certain acceptor-type gap states below the midgap.

Original languageEnglish
Pages (from-to)1787-1790
Number of pages4
JournalJournal of Physics and Chemistry of Solids
Volume64
Issue number9-10
DOIs
Publication statusPublished - 2003 Sept

Fingerprint

Dive into the research topics of 'Interface Fermi level pinning in a Cu/p-CuGaS2 Schottky diode'. Together they form a unique fingerprint.

Cite this