Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

S. Horii; K. Akimoto; S. Ito; T. Emoto; A. Ichimiya; H. Tajiri; W. Yashiro; S. Nakatani; T. Takahashi; H. Sugiyama; X. Zhang; H. Kawata

doi:10.1016/S0039-6028(01)01216-X

Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

S. Horii, K. Akimoto, S. Ito, T. Emoto, A. Ichimiya, H. Tajiri, W. Yashiro, S. Nakatani, T. Takahashi, H. Sugiyama, X. Zhang, H. Kawata

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We studied a buried interface reconstructed structure of the Ag/Si(1 1 1)√3 × √3-Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)√3 × √3-Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.

Original language	English
Pages (from-to)	194-199
Number of pages	6
Journal	Surface Science
Volume	493
Issue number	1-3
DOIs	https://doi.org/10.1016/S0039-6028(01)01216-X
Publication status	Published - 2001 Nov 1
Externally published	Yes

Keywords

Interface states
Surface relaxation and reconstruction
Surface structure, morphology, roughness, and topography
X-ray scattering, diffraction, and reflection

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0039-6028(01)01216-X

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title = "Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction",

abstract = "We studied a buried interface reconstructed structure of the Ag/Si(1 1 1)√3 × √3-Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)√3 × √3-Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.",

keywords = "Interface states, Surface relaxation and reconstruction, Surface structure, morphology, roughness, and topography, X-ray scattering, diffraction, and reflection",

author = "S. Horii and K. Akimoto and S. Ito and T. Emoto and A. Ichimiya and H. Tajiri and W. Yashiro and S. Nakatani and T. Takahashi and H. Sugiyama and X. Zhang and H. Kawata",

note = "Funding Information: This work was supported by a Grant-in-Aid for Creative Basic Research (nos. 08NP1201 and 09NP1201) from the Ministry of Education, Science, Sports and Culture, Japan. This study was performed under the approval of the Photon Factory (PF-PAC nos. 97S1-003 and 2000S2-003). The authors would like to thank Prof. M. Ando, Prof. A. Iida, and Prof. T. Matsushita of the Photon Factory for their help with surface X-ray diffraction measurements.",

year = "2001",

month = nov,

day = "1",

doi = "10.1016/S0039-6028(01)01216-X",

language = "English",

volume = "493",

pages = "194--199",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "1-3",

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TY - JOUR

T1 - Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

AU - Horii, S.

AU - Akimoto, K.

AU - Ito, S.

AU - Emoto, T.

AU - Ichimiya, A.

AU - Tajiri, H.

AU - Yashiro, W.

AU - Nakatani, S.

AU - Takahashi, T.

AU - Sugiyama, H.

AU - Zhang, X.

AU - Kawata, H.

N1 - Funding Information: This work was supported by a Grant-in-Aid for Creative Basic Research (nos. 08NP1201 and 09NP1201) from the Ministry of Education, Science, Sports and Culture, Japan. This study was performed under the approval of the Photon Factory (PF-PAC nos. 97S1-003 and 2000S2-003). The authors would like to thank Prof. M. Ando, Prof. A. Iida, and Prof. T. Matsushita of the Photon Factory for their help with surface X-ray diffraction measurements.

PY - 2001/11/1

Y1 - 2001/11/1

N2 - We studied a buried interface reconstructed structure of the Ag/Si(1 1 1)√3 × √3-Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)√3 × √3-Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.

AB - We studied a buried interface reconstructed structure of the Ag/Si(1 1 1)√3 × √3-Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)√3 × √3-Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.

KW - Interface states

KW - Surface relaxation and reconstruction

KW - Surface structure, morphology, roughness, and topography

KW - X-ray scattering, diffraction, and reflection

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U2 - 10.1016/S0039-6028(01)01216-X

DO - 10.1016/S0039-6028(01)01216-X

M3 - Article

AN - SCOPUS:18744419114

SN - 0039-6028

VL - 493

SP - 194

EP - 199

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

Abstract

Keywords

ASJC Scopus subject areas

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