Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

S. Horii, K. Akimoto, S. Ito, T. Emoto, A. Ichimiya, H. Tajiri, W. Yashiro, S. Nakatani, T. Takahashi, H. Sugiyama, X. Zhang, H. Kawata

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


We studied a buried interface reconstructed structure of the Ag/Si(1 1 1)√3 × √3-Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)√3 × √3-Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.

Original languageEnglish
Pages (from-to)194-199
Number of pages6
JournalSurface Science
Issue number1-3
Publication statusPublished - 2001 Nov 1
Externally publishedYes


  • Interface states
  • Surface relaxation and reconstruction
  • Surface structure, morphology, roughness, and topography
  • X-ray scattering, diffraction, and reflection

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


Dive into the research topics of 'Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction'. Together they form a unique fingerprint.

Cite this