The interference fringes with a lattice spacing of 1.28 Å for the 220 reflection of cubic boron nitride (BN) have been observed in convergent-beam electron diffraction (CBED) patterns using a JEM-2010F electron microscope. It is demonstrated that the coherent CBED method acts as an interferometer when the two waves passing through both sides of an edge-on stacking fault are superposed coherently. The displacement vectors at stacking faults in Si and TiO2 have been measured.
|Number of pages||5|
|Journal||Journal of Electron Microscopy|
|Publication status||Published - 1996|
- Coherent electron beam
- Convergent-beam electron diffraction
- Interference fringes
- Stacking fault