@article{b71d8602b3c64c27851e0a1f695180e8,
title = "Interferometry by coherent convergent-beam electron diffraction",
abstract = "The interference fringes with a lattice spacing of 1.28 {\AA} for the 220 reflection of cubic boron nitride (BN) have been observed in convergent-beam electron diffraction (CBED) patterns using a JEM-2010F electron microscope. It is demonstrated that the coherent CBED method acts as an interferometer when the two waves passing through both sides of an edge-on stacking fault are superposed coherently. The displacement vectors at stacking faults in Si and TiO2 have been measured.",
keywords = "Coherent electron beam, Convergent-beam electron diffraction, Interference fringes, Interferometry, Stacking fault",
author = "Kenji Tsuda and Michiyoshi Tanaka",
note = "Funding Information: Acknowledgments. The authors are grateful to Dr. I. Yonenaga and Professor K. Sumino of the Institute for Materials Research. Tohoku University for supplying SI bulk crystals, to Dr. 0. Mlshima and Dr. K. Era of National Institute for Research in Inorganic Materials. Japan and Dr. S. Shin of Institute for Solid State Physics, the University of Tokyo for supplying BN bulk crystals, and to Professor T. Fukuda of the Institute for Materiab Research. Tohoku University and Mr. T. Yonezawa of Shinkosha Co.. Ltd. for supplying TiOj bulk crystals. The present study was partly supported by a Grant-in-Aid for Scientific Research from the Ministry of Education. Science and Culture of Japan.",
year = "1996",
doi = "10.1093/oxfordjournals.jmicro.a023413",
language = "English",
volume = "45",
pages = "59--63",
journal = "Journal of Electron Microscopy",
issn = "0022-0744",
publisher = "Oxford University Press",
number = "1",
}