Intermittent contact scanning nonlinear dielectric microscopy

Yoshiomi Hiranaga; Yasuo Cho

doi:10.1063/1.3274138

Intermittent contact scanning nonlinear dielectric microscopy

Yoshiomi Hiranaga, Yasuo Cho

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) was developed as a novel technique for surface topography measurements and observation of domain structures. Domain structures on ferroelectric single crystals were observed with nanoscale resolution using IC-SNDM. The reproducibility of measurements was improved in comparison to a conventional SNDM operated under contact mode, because the tip and/or sample damage are reduced when using intermittent contact mode. The minimum loading force of the probe to provide basic performance was experimentally determined for IC-SNDM.

Original language	English
Article number	023705
Journal	Review of Scientific Instruments
Volume	81
Issue number	2
DOIs	https://doi.org/10.1063/1.3274138
Publication status	Published - 2010

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10.1063/1.3274138

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abstract = "Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) was developed as a novel technique for surface topography measurements and observation of domain structures. Domain structures on ferroelectric single crystals were observed with nanoscale resolution using IC-SNDM. The reproducibility of measurements was improved in comparison to a conventional SNDM operated under contact mode, because the tip and/or sample damage are reduced when using intermittent contact mode. The minimum loading force of the probe to provide basic performance was experimentally determined for IC-SNDM.",

author = "Yoshiomi Hiranaga and Yasuo Cho",

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AB - Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) was developed as a novel technique for surface topography measurements and observation of domain structures. Domain structures on ferroelectric single crystals were observed with nanoscale resolution using IC-SNDM. The reproducibility of measurements was improved in comparison to a conventional SNDM operated under contact mode, because the tip and/or sample damage are reduced when using intermittent contact mode. The minimum loading force of the probe to provide basic performance was experimentally determined for IC-SNDM.

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Intermittent contact scanning nonlinear dielectric microscopy

Abstract

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