Introduction to the special issue: High-k reliability - Status 2009

Luigi Pantisano; Byoung Hun Lee; Masaaki Niwa

doi:10.1109/TDMR.2009.2020666

Introduction to the special issue: High-k reliability - Status 2009

Luigi Pantisano, Byoung Hun Lee, Masaaki Niwa

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	5062540
Pages (from-to)	145-146
Number of pages	2
Journal	IEEE Transactions on Device and Materials Reliability
Volume	9
Issue number	2
DOIs	https://doi.org/10.1109/TDMR.2009.2020666
Publication status	Published - 2009 Jun
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Safety, Risk, Reliability and Quality
Electrical and Electronic Engineering

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10.1109/TDMR.2009.2020666

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title = "Introduction to the special issue: High-k reliability - Status 2009",

author = "Luigi Pantisano and Lee, {Byoung Hun} and Masaaki Niwa",

year = "2009",

month = jun,

doi = "10.1109/TDMR.2009.2020666",

language = "English",

volume = "9",

pages = "145--146",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

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TY - JOUR

T1 - Introduction to the special issue

T2 - High-k reliability - Status 2009

AU - Pantisano, Luigi

AU - Lee, Byoung Hun

AU - Niwa, Masaaki

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SN - 1530-4388

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JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 2

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Introduction to the special issue: High-k reliability - Status 2009

ASJC Scopus subject areas

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