Introduction to the special issue: High-k reliability - Status 2009

Luigi Pantisano, Byoung Hun Lee, Masaaki Niwa

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish
Article number5062540
Pages (from-to)145-146
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Issue number2
Publication statusPublished - 2009 Jun
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this