Abstract
We investigated crystal growth behaviors of silicon melt by using an in-situ monitoring system consisting of a furnace and a microscope. Morphology of solid/liquid interface and directional growth processes of polycrystalline silicon were directly observed. We found two kinds of grain expanding mechanisms. It is suggested that we can control a dominant orientation on a wafer surface of polycrystalline silicon by controlling those two mechanisms during casting method.
Original language | English |
---|---|
Pages (from-to) | 1081-1083 |
Number of pages | 3 |
Journal | Conference Record of the IEEE Photovoltaic Specialists Conference |
Publication status | Published - 2005 Nov 30 |
Event | 31st IEEE Photovoltaic Specialists Conference - 2005 - Lake Buena Vista, FL, United States Duration: 2005 Jan 3 → 2005 Jan 7 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering