The influence of eg electrons on resonant x-ray scattering was studied using RE1-xSrxMnO3 (RE: rare earth) thin films having an electron configuration of (t2g) 3(eg)1-x. Based on the rigorous measurements of the Jahn-Teller (JT) distortion incorporating the buckling of the MnO 6 octahedra, we found that the JT distortion has the dominant effect in accordance with the previous reports. The data regarding the x = 1 sample, in which eg electrons are absent, scales perfectly well with those regarding x = 0.4 samples, confirming that the role played by eg electrons is negligible.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2004 Apr|