Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices

Toyohiro Chikyo; K. Ohmori; T. Nagata; N. Umezawa; M. Haemori; M. Yoshitake; T. Hasegawa; H. Koinuma; K. Yamada

doi:10.1109/VTSA.2008.4530801

Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices

Toyohiro Chikyo, K. Ohmori, T. Nagata, N. Umezawa, M. Haemori, M. Yoshitake, T. Hasegawa, H. Koinuma, K. Yamada

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA
Pages	66-67
Number of pages	2
DOIs	https://doi.org/10.1109/VTSA.2008.4530801
Publication status	Published - 2008 Aug 14
Externally published	Yes
Event	2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Hsinchu, Taiwan, Province of China Duration: 2008 Apr 21 → 2008 Apr 23

Publication series

Name	International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Other

Other	2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA
Country/Territory	Taiwan, Province of China
City	Hsinchu
Period	08/4/21 → 08/4/23

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/VTSA.2008.4530801

Cite this

Chikyo, T., Ohmori, K., Nagata, T., Umezawa, N., Haemori, M., Yoshitake, M., Hasegawa, T., Koinuma, H., & Yamada, K. (2008). Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices. In 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA (pp. 66-67). [4530801] (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). https://doi.org/10.1109/VTSA.2008.4530801

Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices. / Chikyo, Toyohiro; Ohmori, K.; Nagata, T. et al.
2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA. 2008. p. 66-67 4530801 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chikyo, T, Ohmori, K, Nagata, T, Umezawa, N, Haemori, M, Yoshitake, M, Hasegawa, T, Koinuma, H & Yamada, K 2008, Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices. in 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA., 4530801, International Symposium on VLSI Technology, Systems, and Applications, Proceedings, pp. 66-67, 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA, Hsinchu, Taiwan, Province of China, 08/4/21. https://doi.org/10.1109/VTSA.2008.4530801

Chikyo T, Ohmori K, Nagata T, Umezawa N, Haemori M, Yoshitake M et al. Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices. In 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA. 2008. p. 66-67. 4530801. (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). doi: 10.1109/VTSA.2008.4530801

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title = "Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices",

author = "Toyohiro Chikyo and K. Ohmori and T. Nagata and N. Umezawa and M. Haemori and M. Yoshitake and T. Hasegawa and H. Koinuma and K. Yamada",

year = "2008",

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AU - Haemori, M.

AU - Yoshitake, M.

AU - Hasegawa, T.

AU - Koinuma, H.

AU - Yamada, K.

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BT - 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA

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Y2 - 21 April 2008 through 23 April 2008

ER -

Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices

Publication series

Other

ASJC Scopus subject areas

Access to Document

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