TY - JOUR
T1 - Large tunneling magnetoresistance at room temperature using a Heusler alloy with the B2 structure
AU - Inomata, Koichiro
AU - Okamura, Susumu
AU - Goto, Ryota
AU - Tezuka, Nobuki
PY - 2003/4/15
Y1 - 2003/4/15
N2 - A Co2Cr0.6Fe0.4Al Heusler alloy film exhibited a B2 structure, which was deposited using a magnetron sputtering system on a thermally oxidized Si substrate at room temperature without any buffer layers. The film exhibited the magnetic moment of 2.04μB per formula unit, nearly the integer number of Bohr magnetons, suggesting a localized nature of ferromagnetism similar to that of many Heusler compounds, which is a necessary condition for half metallicity. A spin- valve-type tunneling junction with a Co2(Cr, Fe)Al Heusler alloy film was fabricated using metal masks, which consists of Co2Cr0.6Fe0.4Al(10 nm)/AlOx (1.8 nm)/CoFe (3 nm)/NiFe (5 nm)/IrMn (15 nm)/Ta (5nm), deposited on a thermally oxidized Si substrate without a buffer layer. The junction demonstrated large tunneling magnetoresistance of 16% at room temperature and 26.5% at 5 K.
AB - A Co2Cr0.6Fe0.4Al Heusler alloy film exhibited a B2 structure, which was deposited using a magnetron sputtering system on a thermally oxidized Si substrate at room temperature without any buffer layers. The film exhibited the magnetic moment of 2.04μB per formula unit, nearly the integer number of Bohr magnetons, suggesting a localized nature of ferromagnetism similar to that of many Heusler compounds, which is a necessary condition for half metallicity. A spin- valve-type tunneling junction with a Co2(Cr, Fe)Al Heusler alloy film was fabricated using metal masks, which consists of Co2Cr0.6Fe0.4Al(10 nm)/AlOx (1.8 nm)/CoFe (3 nm)/NiFe (5 nm)/IrMn (15 nm)/Ta (5nm), deposited on a thermally oxidized Si substrate without a buffer layer. The junction demonstrated large tunneling magnetoresistance of 16% at room temperature and 26.5% at 5 K.
KW - Heusler alloy
KW - Magnetic moment
KW - Magnetoresistance
KW - Structure
KW - Temperature dependence
KW - Tunnel
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U2 - 10.1143/jjap.42.l419
DO - 10.1143/jjap.42.l419
M3 - Letter
AN - SCOPUS:0037594159
SN - 0021-4922
VL - 42
SP - L419-L422
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 4 B
ER -