Layer-by-layer crystallization of Co 2FeSi Heusler alloy thin films

L. R. Fleet; G. Cheglakov; K. Yoshida; V. K. Lazarov; T. Nakayama; A. Hirohata

doi:10.1088/0022-3727/45/3/032001

Layer-by-layer crystallization of Co ₂FeSi Heusler alloy thin films

L. R. Fleet, G. Cheglakov, K. Yoshida, V. K. Lazarov, T. Nakayama, A. Hirohata

Research output: Contribution to journal › Review article › peer-review

10 Citations (Scopus)

Abstract

Grain-size evolution with increasing annealing time has been investigated in polycrystalline Co ₂FeSi films. The samples were prepared by sputtering giving differing grain sizes. Large grains were formed after annealing at 500°C, with grains over 200nm forming in the L2 ₁ phase in a layer-by-layer mode. Further annealing causes a decrease in the average grain size, agreeing well with previously reported results for Co ₂MnSi. Magnetic measurements showed moments with values of up to 75% of those predicted from the SlaterPauling curve providing further evidence for the formation of the L2 ₁ phase.

Original language	English
Article number	032001
Journal	Journal of Physics D: Applied Physics
Volume	45
Issue number	3
DOIs	https://doi.org/10.1088/0022-3727/45/3/032001
Publication status	Published - 2012 Jan 25
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Acoustics and Ultrasonics
Surfaces, Coatings and Films

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10.1088/0022-3727/45/3/032001

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title = "Layer-by-layer crystallization of Co 2FeSi Heusler alloy thin films",

abstract = "Grain-size evolution with increasing annealing time has been investigated in polycrystalline Co 2FeSi films. The samples were prepared by sputtering giving differing grain sizes. Large grains were formed after annealing at 500°C, with grains over 200nm forming in the L2 1 phase in a layer-by-layer mode. Further annealing causes a decrease in the average grain size, agreeing well with previously reported results for Co 2MnSi. Magnetic measurements showed moments with values of up to 75% of those predicted from the SlaterPauling curve providing further evidence for the formation of the L2 1 phase.",

author = "Fleet, {L. R.} and G. Cheglakov and K. Yoshida and Lazarov, {V. K.} and T. Nakayama and A. Hirohata",

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T1 - Layer-by-layer crystallization of Co 2FeSi Heusler alloy thin films

AU - Fleet, L. R.

AU - Cheglakov, G.

AU - Yoshida, K.

AU - Lazarov, V. K.

AU - Nakayama, T.

AU - Hirohata, A.

PY - 2012/1/25

Y1 - 2012/1/25

N2 - Grain-size evolution with increasing annealing time has been investigated in polycrystalline Co 2FeSi films. The samples were prepared by sputtering giving differing grain sizes. Large grains were formed after annealing at 500°C, with grains over 200nm forming in the L2 1 phase in a layer-by-layer mode. Further annealing causes a decrease in the average grain size, agreeing well with previously reported results for Co 2MnSi. Magnetic measurements showed moments with values of up to 75% of those predicted from the SlaterPauling curve providing further evidence for the formation of the L2 1 phase.

AB - Grain-size evolution with increasing annealing time has been investigated in polycrystalline Co 2FeSi films. The samples were prepared by sputtering giving differing grain sizes. Large grains were formed after annealing at 500°C, with grains over 200nm forming in the L2 1 phase in a layer-by-layer mode. Further annealing causes a decrease in the average grain size, agreeing well with previously reported results for Co 2MnSi. Magnetic measurements showed moments with values of up to 75% of those predicted from the SlaterPauling curve providing further evidence for the formation of the L2 1 phase.

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DO - 10.1088/0022-3727/45/3/032001

M3 - Review article

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JO - Journal Physics D: Applied Physics

JF - Journal Physics D: Applied Physics

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ER -

Layer-by-layer crystallization of Co ₂FeSi Heusler alloy thin films

Abstract

ASJC Scopus subject areas

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