Abstract
We described a newly developed characterization technique that dislocation density could be individually determined for each texture component of plastically deformed metals by combining the line-profile analysis with the texture analysis by using X-ray diffraction. This method was applied to major texture components of cube, copper, and brass evolved in cold-rolled copper sheets. The Warren-Averbach procedure using two diffraction peaks was used for estimating the dislocation density. An increase in the dislocation density with the rolling reduction was evaluated for individual texture components. Although the individual texture components underwent the different slip paths, the dislocation densities in these texture components were almost comparable; however, the non-texture component was shown to have a higher dislocation density than the texture components. The recovery and recrystallization proceeded preferentially in the non-texture component.
Original language | English |
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Pages (from-to) | 705-713 |
Number of pages | 9 |
Journal | High Temperature Materials and Processes |
Volume | 35 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2016 Aug 1 |
Keywords
- copper
- dislocation
- line-profile analysis
- recrystallization
- texture
- X-ray diffraction