Linewidth and RIN measurements of longitudinal modes in ultrahigh-speed mode-locked laser diodes

Kentaro Haneda, Hiroyuki Yokoyama, Yo Ogawa, Masataka Nakazawa

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The longitudinal linewidth and corresponding RIN of 10 and 40-GHz mode-locked laser diodes are measured for the first time. The cavity Q-value is a dominant parameter of the linewidth. The mode-dependence of the RIN is observed.

Original languageEnglish
Title of host publicationInternational Conference on Ultrafast Phenomena, UP 2004
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)3540241108
Publication statusPublished - 2004
EventInternational Conference on Ultrafast Phenomena, UP 2004 - Niigata, Japan
Duration: 2004 Jul 252004 Jul 30

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceInternational Conference on Ultrafast Phenomena, UP 2004
Country/TerritoryJapan
CityNiigata
Period04/7/2504/7/30

Fingerprint

Dive into the research topics of 'Linewidth and RIN measurements of longitudinal modes in ultrahigh-speed mode-locked laser diodes'. Together they form a unique fingerprint.

Cite this