Abstract
Local density of states (LDOS) in zero-dimensional (0D) semiconductor structures were characterized using low-temperature scanning tunneling microscopy (LT-STM). These features were consistently explained using a simple model.
Original language | English |
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Article number | 196804 |
Pages (from-to) | 196804/1-196804/4 |
Journal | Physical Review Letters |
Volume | 87 |
Issue number | 19 |
Publication status | Published - 2001 Nov 5 |