Abstract
Stress mapping in a thermally grown oxide (TGO) was carried out using a near field optical microscope. The local stress distribution in a TGO layer of a thermal barrier coating system after thermal exposure was measured. Results demonstrated that the stress in the TGO layer was non-uniform, and the lowest compressive stresses in the TGO layer were found to be close to the bond-coat.
Original language | English |
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Pages (from-to) | 137-141 |
Number of pages | 5 |
Journal | Scripta Materialia |
Volume | 50 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2004 Jan 1 |
Keywords
- Near-field optical microscope
- Photoluminescence spectroscopy
- Stress distribution
- Thermal barrier coating
- Thermally-grown-oxide (TGO)
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics