Logic gate threshold voltage controllable single metal gate FinFET CMOS inverters implemented by using co-integration of 3T/4T-FinFETs

Y. X. Liu, T. Sekigawa, T. Hayashida, T. Matsukawa, K. Endo, S. O'Uchi, K. Sakamoto, K. Ishii, T. Tsukada, Y. Ishikawa, H. Yamauchi, A. Ogura, H. Koike, E. Suzuki, M. Masahara

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publication2008 IEEE International SOI Conference Proceedings
Number of pages2
Publication statusPublished - 2008
Event2008 IEEE International SOI Conference - New Paltz, NY, United States
Duration: 2008 Oct 62008 Oct 9

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X


Conference2008 IEEE International SOI Conference
Country/TerritoryUnited States
CityNew Paltz, NY

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