Magnetic and structural properties of MnBi films with thicknesses up to 50 nm were investigated. Thin films of the MnBi LTP (Low Temperature Phase) were fabricated onto silica-glass substrates by sputter-deposition of Bi/Mn multilayer, followed by a subsequent annealing at about 550 °C for 30 min. Coercivity of such thin films is higher than 15 kOe, even though the film thickness is about 10 nm. These thin films show the preferential growth of c-axis of the LTP along the film normal. Moreover, high resolution transmission electron microscopy indicates that the LTP regions of 30-50 nm in size are physically isolated by Bi. The magnetization reversal mechanism of such a LTP region is mainly governed by a coherent rotation mode based on the δM curve measurement.
|Journal||Journal of Applied Physics|
|Publication status||Published - 2014 May 7|
ASJC Scopus subject areas
- Physics and Astronomy(all)