Abstract
We have performed static magnetic susceptibility and ESR measurements on the X-ray-irradiated organic Mott insulator -(BEDT-TTF)2Cu[N(CN)2]Cl. The Néel temperature and the spin-flop transition field decrease with increasing irradiation dose. In the ESR signal at 4 K, a paramagnetic component (15%) from itinerant carriers appears after irradiation in addition to the parent antiferromagnetic (85%) and minor paramagnetic localized spin components. We propose that domains of the itinerant carriers with a size on the ten nanometer scale are induced around the molecular defects randomly introduced by X-ray irradiation.
Original language | English |
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Article number | 063706 |
Journal | Journal of the Physical Society of Japan |
Volume | 79 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2010 |
Keywords
- BEDT-TTF
- Carrier doping
- ESR
- Mott insulator
- Static susceptibility
- X-ray irradiation