Martensitic transformation and microstructure of sputter-deposited Ni-Mn-Ga films

Volodymyr A. Chernenko, Manfred Kohl, Victor A. L'vov, Volodymyr M. Kniazkyi, Makoto Ohtsuka, Oliver Kraft

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)


The martensitic transformation and microstructure of Ni-Mn-Ga films deposited on an alumina substrate and annealed at 1073 K for 36 ks are studied. Electrical resistivity and calorimetry measurements reveal a non-monotonous thickness dependence of the martensitic start temperature, Tms, at submicron film thickness. Focused Ion Beam (FIB) and standard SEM techniques are used to clarify the film microstructure. A martensitic morphology of films is confirmed by the FIB imaging to be a laminated twin structure aligned almost parallel to the film plane in each crystallite as a consequence of {110}-type crystallographic texture. A thermodynamic model based on the Landau formalism taking into account the substructure of the film and the elastic interaction between film and substrate describes the essential features of the thickness dependence of Tms.

Original languageEnglish
Pages (from-to)619-624
Number of pages6
JournalMaterials Transactions
Issue number3
Publication statusPublished - 2006 Mar


  • Alumina substrate
  • Martensitic morphology
  • Martensitic transformation temperatures
  • Modeling
  • Nickel-manganese-gallium thin films

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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