May the fourth (terminal) be with you - Circuit design beyond FinFet

Hanpei Koike; Shin Ichi O'uchi; Masakazu Hioki; Kazuhiko Endo; Takashi Matsukawa; Yongxun Liu; Meishoku Masahara; Toshiyuki Tsutsumi; Kunihiro Sakamoto; Tadashi Nakagawa; Toshihiro Sekigawa

doi:10.1109/IEDM.2010.5703381

May the fourth (terminal) be with you - Circuit design beyond FinFet

Hanpei Koike, Shin Ichi O'uchi, Masakazu Hioki, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Meishoku Masahara, Toshiyuki Tsutsumi, Kunihiro Sakamoto, Tadashi Nakagawa, Toshihiro Sekigawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2010 IEEE International Electron Devices Meeting, IEDM 2010
DOIs	https://doi.org/10.1109/IEDM.2010.5703381
Publication status	Published - 2010 Dec 1
Externally published	Yes
Event	2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States Duration: 2010 Dec 6 → 2010 Dec 8

Publication series

Name	Technical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)	0163-1918

Other

Other	2010 IEEE International Electron Devices Meeting, IEDM 2010
Country/Territory	United States
City	San Francisco, CA
Period	10/12/6 → 10/12/8

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Access to Document

10.1109/IEDM.2010.5703381

Cite this

Koike, H., O'uchi, S. I., Hioki, M., Endo, K., Matsukawa, T., Liu, Y., Masahara, M., Tsutsumi, T., Sakamoto, K., Nakagawa, T., & Sekigawa, T. (2010). May the fourth (terminal) be with you - Circuit design beyond FinFet. In 2010 IEEE International Electron Devices Meeting, IEDM 2010 [5703381] (Technical Digest - International Electron Devices Meeting, IEDM). https://doi.org/10.1109/IEDM.2010.5703381

Koike, H, O'uchi, SI, Hioki, M, Endo, K, Matsukawa, T, Liu, Y, Masahara, M, Tsutsumi, T, Sakamoto, K, Nakagawa, T & Sekigawa, T 2010, May the fourth (terminal) be with you - Circuit design beyond FinFet. in 2010 IEEE International Electron Devices Meeting, IEDM 2010., 5703381, Technical Digest - International Electron Devices Meeting, IEDM, 2010 IEEE International Electron Devices Meeting, IEDM 2010, San Francisco, CA, United States, 10/12/6. https://doi.org/10.1109/IEDM.2010.5703381

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title = "May the fourth (terminal) be with you - Circuit design beyond FinFet",

author = "Hanpei Koike and O'uchi, {Shin Ichi} and Masakazu Hioki and Kazuhiko Endo and Takashi Matsukawa and Yongxun Liu and Meishoku Masahara and Toshiyuki Tsutsumi and Kunihiro Sakamoto and Tadashi Nakagawa and Toshihiro Sekigawa",

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doi = "10.1109/IEDM.2010.5703381",

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T1 - May the fourth (terminal) be with you - Circuit design beyond FinFet

AU - Koike, Hanpei

AU - O'uchi, Shin Ichi

AU - Hioki, Masakazu

AU - Endo, Kazuhiko

AU - Matsukawa, Takashi

AU - Liu, Yongxun

AU - Masahara, Meishoku

AU - Tsutsumi, Toshiyuki

AU - Sakamoto, Kunihiro

AU - Nakagawa, Tadashi

AU - Sekigawa, Toshihiro

PY - 2010/12/1

Y1 - 2010/12/1

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U2 - 10.1109/IEDM.2010.5703381

DO - 10.1109/IEDM.2010.5703381

M3 - Conference contribution

AN - SCOPUS:79951818906

SN - 9781424474196

T3 - Technical Digest - International Electron Devices Meeting, IEDM

BT - 2010 IEEE International Electron Devices Meeting, IEDM 2010

T2 - 2010 IEEE International Electron Devices Meeting, IEDM 2010

Y2 - 6 December 2010 through 8 December 2010

ER -

May the fourth (terminal) be with you - Circuit design beyond FinFet

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ASJC Scopus subject areas

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