Measurement of electric potential distributions around FEG-emitters by electron holography

Tetsuo Oikawa; Joong Jung Kim; Takeshi Tomita; Hyun Soon Park; Daisuke Shindo

doi:10.1093/jmicro/dfm022

Measurement of electric potential distributions around FEG-emitters by electron holography

Tetsuo Oikawa, Joong Jung Kim, Takeshi Tomita, Hyun Soon Park, Daisuke Shindo

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

An evaluation technique for field emission guns (FEG-emitters) was established by using electron holography. For performing electron holography under an applied voltage, a specimen holder with the capabilities of three-directional motion as well as voltage application was developed. An unused Schottky emitter and a used emitter that had failed after operating for about 10 000 h were selected for this study. By visualizing the electric potential distributions around the emitters, it was clarified that a change in the edge shape of the emitter led to the change in the strength of the electric field. The observations revealed that electron holography can be applied to evaluate the performances of the various emitters.

Original language	English
Pages (from-to)	171-175
Number of pages	5
Journal	Journal of Electron Microscopy
Volume	56
Issue number	5
DOIs	https://doi.org/10.1093/jmicro/dfm022
Publication status	Published - 2007 Oct

Keywords

Electric potential distribution
Electron holography
FEG-emitter

ASJC Scopus subject areas

Instrumentation

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10.1093/jmicro/dfm022

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title = "Measurement of electric potential distributions around FEG-emitters by electron holography",

abstract = "An evaluation technique for field emission guns (FEG-emitters) was established by using electron holography. For performing electron holography under an applied voltage, a specimen holder with the capabilities of three-directional motion as well as voltage application was developed. An unused Schottky emitter and a used emitter that had failed after operating for about 10 000 h were selected for this study. By visualizing the electric potential distributions around the emitters, it was clarified that a change in the edge shape of the emitter led to the change in the strength of the electric field. The observations revealed that electron holography can be applied to evaluate the performances of the various emitters.",

keywords = "Electric potential distribution, Electron holography, FEG-emitter",

author = "Tetsuo Oikawa and Kim, {Joong Jung} and Takeshi Tomita and Park, {Hyun Soon} and Daisuke Shindo",

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AU - Oikawa, Tetsuo

AU - Kim, Joong Jung

AU - Tomita, Takeshi

AU - Park, Hyun Soon

AU - Shindo, Daisuke

PY - 2007/10

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AB - An evaluation technique for field emission guns (FEG-emitters) was established by using electron holography. For performing electron holography under an applied voltage, a specimen holder with the capabilities of three-directional motion as well as voltage application was developed. An unused Schottky emitter and a used emitter that had failed after operating for about 10 000 h were selected for this study. By visualizing the electric potential distributions around the emitters, it was clarified that a change in the edge shape of the emitter led to the change in the strength of the electric field. The observations revealed that electron holography can be applied to evaluate the performances of the various emitters.

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KW - Electron holography

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Measurement of electric potential distributions around FEG-emitters by electron holography

Abstract

Keywords

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